Invited Speakers
Inside Program: Conference Program l Keynote Speakers l Tutorials
Workshops l Year in Review l Highlight Papers | Invited Speakers
Invited Speakers
| Topic | Speaker | Title |
|---|---|---|
| Circuit Reliability and Aging | Hussam Amrouch (Technische Universität München) | Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor |
| Emerging Memory | Uwe Schroeder (Namlab) | Ferroelectric HfO2-based Capacitors for FeRAM: Reliability from Single Devices to Memory Arrays |
| GaN Devices | Sandeep Bahl (Texas Instruments) | Status of JEDEC JC-70 Standards for GaN Power Devices Characterization and Reliability |
| Gate/MOL Dielectrics | Masaharu Kobayashi (The University of Tokyo) | Performance and reliability of nanosheet oxide semiconductor FETs with ALD-grown InGaO for 3D integration |
| Gate/MOL Dielectrics | Huimei Zhou (IBM) | TDDB on gate-all-around nanosheets |
| Memory Reliability | Robert Frickey (Solidigm) | Comparing the Reliability of Solid State Drives based on TLC and QLC NAND Flash Memories |
| Metallization/BEOL Reliability | Markus Herklotz (GlobalFoundries) | EDA method to address interconnect reliability and reduce overdesign in custom analog designs |
| Neuromorphic Computing Reliability | Kasidit Toprasertpong (The University of Tokyo & Stanford University) | Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing |
| Packaging and 2.5/3D Assembly | Kaushik Mysore (AMD) | 2.5/3D Package Reliability |
| Product Reliability | Tianhao Zhang (Ansys) | Design for Reliability (DFR) Aware EDA Solution for Product Reliability |
| Radiation Effect Reliability | Enxia Zhang (University of Central Florida) | Charge Trapping in Irradiated 3D Devices and ICs |
| Reliability Testing | Robert Herrick (Robert Herrick Consulting) | Reliability testing for silicon photonics and optoelectronics |
| RF/mmW/5G | Jeremy Dunworth (Qualcomm) | RF/mmW 5G/beyond 5G: advances & reliability |
| SiC Devices | Peter Moens (onsemi) | Evaluating SiC MOSFET Gate Reliaibility, Life Models and Safe Operating Area |
| System Electronics Reliability | Pradeep Lall(Auburn University) | Assessment of Fracture Propensity of Flip-Chip Ball Grid Array Interfaces under Deformation and Fatigue Loads at Sustained High Temperatures |
| Transistors | Myunggil Kang (Samsung) | Device design and reliability of GAA MBCFET |