Best Paper

2024 IRPS Best Paper

Best Paper

A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation

Rakesh Ranjan, Pavitra R. Perepa, Ki-Don Lee, Ashish K. Jha, Kartika C. Sahoo, Kayla N. Sanders, Robert Moeller, Prateek Sharma, Minhyo Kang and Peter Kim

Best Student Paper

Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis

Yong Hyeon Yi, Chris Kim, Armen Kteyan, Alexander Volkov, Stephane Moreau and Valeriy Sukharev

Best Poster Presentation

Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS

Wei-Chun Wang, Shida Zhang, Sudarshan Sharma, Minah Lee and Saibal Mukhopadhyay

People’s Choice Paper

Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays

J. Laguerre, S. Martin, J. Coignus, C. Carabasse, M. Bocquet, F. Andrieu and L. Grenouillet

People’s Choice Poster Presentation

Microscopic Modeling of MgO Barrier Degradation Due to Interface Oxygen Frenkel Defects in Scaled MTJ Toward High-Density STT-MRAM

Rina Takashima, Takeo Koike, Shogo Itai, Hideyuki Sugiyama, Young Min Lee, Masaru Toko, Soichiro Ono, Daisuke Watanabe, Soichi Oikawa, Katsuhiko Koi, Hiroyuki Kanaya, Kohji Nakamura and Masahiko Nakayama

2023 IRPS Best Paper

Best Paper

Towards a Universal Model of Dielectric Breakdown

Andrea Padovani, Paolo La Torraca, Jack Strand, Alexander Shluger, Valerio Milo and Luca Larcher

Best Student Papers

Thermomigration-induced void formation in Cu-interconnects - Assessment of main physical parameters

Y. Ding, O. Varela Pedreira, M. Lofrano, H. Zahedmanesh, T. Chavez, H. Farr, I. De Wolf and K. Croes

Towards Understanding the Physics of Gate Switching Instability in Silicon Carbide MOSFETs

Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Paul Salmen, Gerald Rescher, Wolfgang Gustin and Tibor Grasser

Best Poster Presentation

Polarity Dependency of MOL-TDDB in FinFET

Manisha Sharma, Hokyung Park, Yinghong Zhao, Ki-Don Lee, Liangshan Chen, Joonah Yoon, Rakesh Ranjan, Caleb Dongkyan Kwon, Hyewon Shim, Myung Soo Yeo, Shinyoung Chung and Jon Haefner

2022 IRPS Best Paper

Best paper

Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets

E. Bury, A. Chasin, B. Kaczer, M. Vandemaele, S. Tyaginov, J. Franco, R. Ritzenthaler, H. Mertens, P. Weckx, N. Horiguchi, D. Linten

Best Student paper

The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena

Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi

Best Poster Presentation

Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance

L. Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, O. Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, M. Otto, A. Zaka, J. Hoentschel