2021 IRPS & IEW Tutorials

Tutorial sessions offer a supreme overview of reliability in semiconductors, circuits, systems unavailable at any other venue at a tremendous value. IRPS conference has a very long history of dedicating two full days to the Tutorials sessions. Since 2011, IRPS conference has offered 129 tutorial 90 minute sessions with an average of over 21 unique sessions per year delivered by industry, academia, and government experts. IRPS tutorial program is designed for the newcomer, the informed, and the expert so whether one is a university student, a field practitioner, or an IEEE fellow, all may gain knowledge in their area or an adjacent one.

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View the Full 2021 Program for Workshop Abstracts and Bios (begins on page 110).

1. Tut1 l Reliability Challenges with 3D Integration of Semiconductor Packaging l Enamul Kabir - Intel

2. Tut2 l Practical Applications of Bayesian Reliability l Yan Liu - Medtronic

3. Tut3 l Methodologies for Device Reliability Testing: From DC to Sub-ns l Yi Zhao - Zhejiang University

4. Tut4 l 5G/mmW/RF- Silicon - 5G/mmW/RF-GaN l Fernando Guarin - Globalfoundries l Don Gajewski - Wolfspeed

5. Tut5 l Neuromorphic Computing l Brian Hoskins - NIST

6. Tut6 l Calculation of Terrestrial Cosmic Ray Displacement Damage l Melanie Raine - CEA

7. Tut7 l Understanding and Challenges of MOL/BEOL TDDB Reliability l Andrew Kim - Intel

8. Tut8 l GaN Reliability l Enrico Zanoni - University of Padova

9. Tut9 l High-K Dielectrics on Non Silicon Semiconductors l Chadwin Young - University of Texas - Dallas

10. Tut10 l Advanced 3D Flash Memory Architectures l Hang Ting Lue - Macronix

11. Tut11 l Magnetic Resonance Techniques l Mark Anders - NIST

12. Tut12 l DRAM Reliability Overview l Hokyung Park - SK hynix

13. Tut13 l Hot-carrier Degradation in Si Devices – from Experimental Observations to Accurate Physical Modeling l Stanislav Tyaginov - IMEC

14. Tut14 l Metal reliability for advanced interconnects l Olalla Varela - IMEC

15. Tut15 l Automotive l Andreas Aal - Volkswagen (in cooperation with IEW) l Oliver Aubel - Globafoundries

16. Tut16 l Reliability and Performance Limiting Defects in 4H SiC Metal Oxide Semiconductor Field Effect Transistors l Patrick Lenahan- Penn State University

17. Tut17 l Application and characterization of CMOS cryogenic electronics l Pragya Shrestha - NIST

18. Tut18 l Electronic Design Automation (EDA) Solutions for Latch-up Verification in CMOS and HV Technologies l Michael Khazhinsky - Silicon Labs (in cooperation with IEW)

19. Tut19 l EOS, ESD, Transient, AMR, EIPD, Robustness, Aging - Do All of These Pieces go to the Same Puzzle? l Hans Kunz - Texas Instruments (in cooperation with IEW)

20. Tut20 l Exploring Relation of ESD and EMC: Tests, Events to Damage, Failure Types, and Co-Design Approaches l Alan Righter - Analog Devices

21. Tut21 l FinFET Self-heating: Measurements, Concerns and Applications l Zakariae Chbili - Intel (in cooperation with IEW)

22. Tut22 l Full chip CDM ESD Verification l Melanie Etherton - NXP