Conference Information


2016 IEEE International Reliability Physics Symposium

April 17-21, 2016
Pasadena Convention Center
Pasadena, CA USA

Registration for the 2016 IRPS is now available

The IRPS Late News submission deadline was January 11, 2016, and is now closed

2016 Call for Papers

For a listing of the IRPS Program Committee and topics, click here

For 54 years, IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment.

IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world. We look forward to seeing you in Pasadena!


Corporate Patrons for 2016:

Platinum Level

Gold Level
Attendee Sponsorship

Co-sponsored by:

                    IEEE Electron Devices Society                     IEEE Reliability Society

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