IRPS

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IRPS 2020 Virtual Conference Sessions Download the Program at a Glance
IRPS Opening & Plenary Keynotes
Welcome & IntroductionGeneral Chair: Gaudenzio Meneghesso, University of Padova, Italy
Overview of Technical ProgramTechnical Program Chair: Charles Slayman, Cisco Systems, USA
Plenary Keynotes I. Michael C. Mayberry, Intel, United States
II. Oliver Häberlen, Infineon Technologies Austria AG, Austria
III. Gianluca Boselli, Texas Instruments, United States
Awards & Best Papers Vice General Chair: Robert Kaplar, Sandia, USA
Introduction for IRPS 2021Vice General Chair: Robert Kaplar, Sandia, USA
TutorialsSession Chair: Susumu Shuto
Basics of Semiconductor Reliabilty I
Basics of Semiconductor Reliabilty II
Memory Reliability / Power Devices Reliability
Circuit & System Reliability
Year-in-ReviewSession Chair: Robert Kaplar
Technical Presentations
Beyond CMOS DevicesSession Chair: Chalres Slayman
Circuit Reliability and AgingSession Chair: James Tschanz
ESD and LatchupSession Chair: Shin-Hung Chen
Failure AnalysisSession Chair: Jane Li
Gate/MOL DielectricsSession Chair: Mario Lanza
IC Product ReliabilitySession Chair: Jae-Gyung Ahn
Memory ReliabilitySession Chair: Ming-Yi Lee
Metallization/BEOL ReliabilitySession Chair: Baozhen Li
Neuromorphic Computing ReliabilitySession Chair: Matt Marinella
Packaging and 2.5/3D Assembly Session Chair: Rohit Grover
Process IntegrationSession Chair: Mustapha Rafik
Reliability TestingSession Chair: Jifa Hao
RF/mmW/5G ReliabilitySession Chair: Farid Medjdoub
Soft ErrorSession Chair: Indranil Chatterjee
System Electronics ReliabilitySession Chair: Jay Sarkar
Transistors ISession Chair: Jacopo Franco
Transistors IISession Chair: Jacopo Franco
Wide-Bandgap Semiconductors - GaNSession Chair Introduction: Sameh Kahlil
Wide-Bandgap Semiconductors - SiCSession Chair Introduction: Thomas Aichinger