To join Virtual IRPS 2020 Reliability Year in Review, click the session link

Year-in-ReviewSession Chair: Robert Kaplar
Session Chair Introduction: Robert Kaplar
YA1 - Circuit Reliability: Main ReviewJames Tschanz, Intel Corporation, United States
YA2 - Circuit Reliability: EDA aspects Georgios Konstadinidis, , Google, United States
YA3 - RF/mmW/5G Reliability: CMOS/SiGeFernando Guarin, GLOBALFOUNDRIES, United States
YA4 - RF/mmW/5G Reliability: GaN HEMTEnrico Zanoni, Univ. of Padova, Italy
YA5 - MemoryChandra Mouli, Micron, United States