2020 IRPS Tutorials

Tutorial sessions offer a supreme overview of reliability in semiconductors, circuits, systems unavailable at any other venue at a tremendous value. IRPS conference has a very long history of dedicating two full days to the Tutorials sessions. Since 2011, IRPS conference has offered 129 tutorial 90 minute sessions with an average of over 21 unique sessions per year delivered by industry, academia, and government experts. IRPS tutorial program is designed for the newcomer, the informed, and the expert so whether one is a university student, a field practitioner, or an IEEE fellow, all may gain knowledge in their area or an adjacent one.

March 29th - TimeSunday Track 1Sunday Track 2Sunday Track 3
8:30-10:00amBias Temperature Instabilities: best practices for reliability benchmarking and optimization based on recent theoretical insights
Jacopo Franco (imec)
Terrestrial Radiation and Its Impact on the Reliability Performance of Microelectronics
Robert Baumann (Radiosity Solutions LLC & Southern Methodist University)
No lecture
10:30-noonSelf-heating: assessment methodologies, impact on reliability and prospects for future technology solutions
Erik Bury (imec)
Plasma-induced damage—modeling, characterizations, and design methodologies
Koji Eriguchi (Kyoto University)
No lecture
1:30-3:00pmElectromigration: physics, rule, validation, and relaxation
Young-Joon Park (Texas Instruments)
SONOS or Charge Trap Memories
Krishnaswamy T. Ramkumar (Cypress)
Electronic Design Automation (EDA) Solutions for Latch-up Verification in CMOS and HV Technologies
Michael Khazhinsky (Silicon Labs)
3:30-5:00pmIntroduction to RF and Mixed-Signal Circuit Reliability.
Vijay Reddy (Texas Instruments)
Basic Reliability Physics: Acceleration Models, Statistical Methods, and Defect Screening
Mark Porter (Medtronic)
EOS, ESD, Transient, AMR, EIPD, Robustness, Aging —do all of these pieces go to the same puzzle?
Hans Kunz (Texas Instruments)

March 30th - TimeMonday Track 1Monday Track 2Monday Track 3Monday Track 4Monday Track 5
8:00-9:30amThe role of defects on reliability aspects in GaN power devices
Clemens Ostermaier (Infineon)
Scaling Impacts on Reliability of p-STT MRAM Cells
Toshio Sunaga (ExIBM)
Reliability-aware Energy-efficient Smart-IoT & Cognitive-5G
Sidina Wane (eV-technology) & Vincent Huard (Dolphin Design)
Topics: Automotive
Title: tbd
Andreas Aal (Volkswagen) and Oliver Aubel (GlobalFoundries)
Exploring Relation of ESD and EMC: Tests, Events to Damage, Failure Types, and Co-Design Approaches
Alan Righter (Analog Devices)
10:00-11:30amSystem-Focused Reliability of SiC MOSFETs
Mrinal Das (Texas Instruments)
Phase Change Memory: Technology Reliability and System-Level Implications
Haralampos Pozidis and Nikolaos Papandreou (IBM Research Zurich)
Challenges in Prognostics and Health Management of Electronic Systems
Dr. Michael H. Azarian (University of Maryland)
TCAD-EDA Assisted BTI-HCD Reliability Framework from Devices to Circuits
Souvik Mahapatra (IIT Bombay)
Full chip CDM ESD Verification
Melanie Etherton (NXP)
12:30-2:00pmTesting for wear and abnormal conditions of Power IGBT modules
Francesco Iannuzzo (Aalborg University)
Designing for Analog Reliability: From Components to Circuits
Speaker: Dhanoop Varghese and Sunglyong Kim (TI)
Materials Analysis Techniques in Semiconductor
Ling Pan (Intel)
Materials engineering challenges for Neuromorphic Computing
Siddarth Krishnan (AMAT)
No lecture