| Type | Topic | Title | Speaker | Affiliation |
|---|---|---|---|---|
| Focus Session | Reliability of SiC Devices I | Ruggedness of SiC devices under extreme conditions | Peter Friedrichs | Infineon |
| Focus Session | Reliability of SiC Devices II | Challenges and peculiarities in developing new standards for SiC | Don Gajewski | Cree/Wolfspeed |
| Focus Session | Reliability of SiC Devices III | Defect spectroscopy in SiC devices | Michael Waltl | TU Vienna |
| Focus Session | Neuromorpic Computing Reliability I | Introduction of Computing in Memory (CIM) by 3D NAND Flash and the Reliability Aspects to Ensure the Accuracy for the Deep-Learning Neural Network | Hang-Ting Lue | Macronix |
| Focus Session | Neuromorpic Computing Reliability II | Embracing the Unreliability of Memory Devices for Neuromorphic Computing | Charles Mackin | IBM, Almaden |
| Focus Session | Neuromorpic Computing Reliability III | Embracing the Unreliability of Memory Devices for Neuromorphic Computing | Damien Querlioz | U. Paris-Sud |
| Focus Session | Circuit Reliability and Aging I | Experimental monitoring of aging in CMOS RF linear power amplifiers: correlation between device and circuit degradation | Rosana Rodriguez Martinez | Universitat Autonoma de Barcelona |
| Focus Session | Circuit Reliability and Aging II | A novel approach to in-field, in-mission reliability monitoring based on deep data | Evelyn Landman | CTO, ProteanTecs |
| Focus Session | Circuit Reliability and Aging III | Aging challenges in on-chip voltage regulator design | Saibal Mukhopadhyay | Georgia Tech |
| Focus Session | Circuit Reliability and Aging IV | An industry-standard approach toward modeling device aging | Colin Shaw | Si2 / Silvaco |
| Focus Session | RF/mmW/5G I | Silicon Based RF Reliability Challenges for 5G Communication | Paul Colestock | GlobalFoundries |
| Focus Session | RF/mmW/5G II | The role of RF operational life testing in evaluating III-V devices addressing RF through millimeter-wave applications | Elias Reese | Qorvo |
| Focus Session | RF/mmW/5G III | Reliability physics of GaN HEMT microwave devices: the age of scaling | Enrico Zanoni | Univ of Padova |
| Regular Session | Transistors | FEOL Reliability Issues in Advanced CMOS Nodes | Inanc Meric | Intel |
| Regular Session | Packaging and 2.5/3D Assembly | Materials and Reliability of Photonic Packaging | John Osenbach | Infinera |
| Regular Session | System Electronics Reliability | Challenges in Prognostics and Health Management of Electronic Systems | Michael Azarian | Univ Maryland/CALCE |
| Regular Session | Failure Analysis | Localization of high speed failures with a novel detection method | Ed Cole | Sandia |
