IRPS

Committee List

IRPS 2020 Committees

This interactive table shows the list of committee chairs, vice-chairs, and past-chairs. The table is sortable by clicking on column headers. The search box uses free-text to find matching instances of whatever is typed.

Sub-CommitteeRoleFirst NameLast NameAffiliation
3D/2.5D/PackagingTopic ChairRohitGroverIntel
3D/2.5D/PackagingVice ChairCS (Prem)PremachandranGlobalFoundries
3D/2.5D/PackagingPast ChairSudarshanRangarajAmazon Lab 126
3D/2.5D/PackagingCommittee MemberRaviAggarwalIntel
3D/2.5D/PackagingCommittee MemberIn-hakBaickSamsung
3D/2.5D/PackagingCommittee MemberPreetiChauhanGoogle
3D/2.5D/PackagingCommittee MemberEmmanuelCheryIMEC
3D/2.5D/PackagingCommittee MemberYCChuangTSMC
3D/2.5D/PackagingCommittee MemberEnamulKabirIntel
3D/2.5D/PackagingCommittee MemberKangwookLeeSK Hynix
3D/2.5D/PackagingCommittee MemberJohnOsenbachInfinera
3D/2.5D/PackagingCommittee MemberAshokPachamuthuMaxim
3D/2.5D/PackagingCommittee MemberRichardRaoInPhi
3D/2.5D/PackagingCommittee MemberKanikaSethiIntel
3D/2.5D/PackagingCommittee MemberGuotaoWangFuturewei
3D/2.5D/PackagingCommittee MemberGangYuanMicrosoft
Neuromorphic Computing ReliabilityTopic ChairMatthewMarinellaSandia National Laboratories
Neuromorphic Computing ReliabilityVice ChairKin LeongPeySingapore Univ. of Tech and Design
Neuromorphic Computing ReliabilityPast ChairGennadiBersukerThe Aerospace Corporation
Neuromorphic Computing ReliabilityCommittee MemberStefanoAmbrogioIBM Almaden Research Center
Neuromorphic Computing ReliabilityCommittee MemberAnChenSRC
Neuromorphic Computing ReliabilityCommittee MemberRobinDegraeveIMEC
Neuromorphic Computing ReliabilityCommittee MemberArthurEdwardsAir Force Research Laboratory (AFRL)
Neuromorphic Computing ReliabilityCommittee MemberHiroyukiAkinagaAdvanced Industrial Science and Technology (AIST), Japan
Neuromorphic Computing ReliabilityCommittee MemberTuo-Hung (Alex)HouNational Chiao Tung University, Taiwan
Neuromorphic Computing ReliabilityCommittee MemberDoo SeokJeongHANYANG University (Korea)
Neuromorphic Computing ReliabilityCommittee MemberRozaKotlyarIntel Corporation
Neuromorphic Computing ReliabilityCommittee MemberGabrielMolasLETI (France)
Neuromorphic Computing ReliabilityCommittee MemberSabinaSpigaCNR-IMM, Italy
Neuromorphic Computing ReliabilityCommittee MemberJohn PaulStrachanHewlett Packard Enterprise
Neuromorphic Computing ReliabilityCommittee MemberEric M.VogelGeorgia Institute of Technology
Neuromorphic Computing ReliabilityCommittee MemberRainerWaserRWTH Aachen
Neuromorphic Computing ReliabilityCommittee MemberBinGaoTsinghua University
Circuit Reliability/AgingTopic ChairJamesTschanzIntel
Circuit Reliability/AgingVice ChairFlorianCachoSTMicroelectronics
Circuit Reliability/AgingPast ChairGeorgiosKonstadinidisGoogle
Circuit Reliability/AgingCommittee MemberXinfeiGuoMellanox
Circuit Reliability/AgingCommittee MemberKarlHofmannInfineon
Circuit Reliability/AgingCommittee MemberKazutoshiKobayashiKyoto Institute of Technology
Circuit Reliability/AgingCommittee MemberTomKopleyONSemiconductors
Circuit Reliability/AgingCommittee MemberChrisKimUniversity of Minnesota
Circuit Reliability/AgingCommittee MemberVijayReddyTexas Instruments
Circuit Reliability/AgingCommittee MemberMingooSeokColumbia University
Circuit Reliability/AgingCommittee MemberHyewonShimSamsung
Circuit Reliability/AgingCommittee MemberSriramKalpatQualcomm
Circuit Reliability/AgingCommittee MemberSaibalMukhopadhyayGeorgia Institute of Technology
IRPS/IEEW ESD and LatchupTopic ChairShih-HungChenIMEC
IRPS/IEEW ESD and LatchupVice ChairMototsuguOkushimaRenesas
IRPS/IEEW ESD and LatchupPast ChairGianlucaBoselliTexas Instruments
IRPS/IEEW ESD and LatchupCommittee MemberLorenzoCeratiST Microelectronics
IRPS/IEEW ESD and LatchupCommittee MemberZhongChenUniversity of Arkansas
IRPS/IEEW ESD and LatchupCommittee MemberKaiEsmarkInfineon
IRPS/IEEW ESD and LatchupCommittee MemberNathanJackIntel
IRPS/IEEW ESD and LatchupCommittee MemberJunjunLiESDA
IRPS/IEEW ESD and LatchupCommittee MemberDionyzPoganyTU Wien
IRPS/IEEW ESD and LatchupCommittee MemberMayankShrivastavaIndian Institute of Science
IRPS/IEEW ESD and LatchupCommittee MemberMichaelStockingerNXP
IRPS/IEEW ESD and LatchupCommittee MemberTeruoSuzukiSocionext Inc.
IRPS/IEEW ESD and LatchupCommittee MemberMichaelKhazhinskySilicon Labs
IRPS/IEEW ESD and LatchupCommittee MemberNathanielPeacheyQorvo
Failure AnalysisTopic ChairJaneLiNVidia
Failure AnalysisVice ChairBryanTracyEAG Laboratories
Failure AnalysisPast ChairBaohuaNiuTSMC
Failure AnalysisCommittee MemberKevinJohnsonIntel
Failure AnalysisCommittee MemberJayhoonChungTexas Instruments
Failure AnalysisCommittee MemberStephenFasolinoRaytheon
Failure AnalysisCommittee MemberBrandenForanThe Aerospace Corporation
Failure AnalysisCommittee MemberEckhardLangerGlobalFoundries
Failure AnalysisCommittee MemberPaiboonTangyunyongSandia National Laboratories
Failure AnalysisCommittee MemberNathanDeBardelebenLos Alamos National Laboratory
Failure AnalysisCommittee MemberJasonWheelerRaytheon
Failure AnalysisCommittee MemberMichaelGribelyukWestern Digital
Gate/MOL DielectricsTopic ChairMarioLanzaSoochow University
Gate/MOL DielectricsVice ChairFrancesco MariaPuglisiUniversity of Modena and Reggio Emilia
Gate/MOL DielectricsPast ChairNagarajanRaghavanSingapore U. of Technology and Design
Gate/MOL DielectricsCommittee MemberRaviAchantaGlobalFoundries
Gate/MOL DielectricsCommittee MemberShih-ChangChenTSMC
Gate/MOL DielectricsCommittee MemberFeiHuiTechnion
Gate/MOL DielectricsCommittee MemberMiaomiaoWangIBM
Gate/MOL DielectricsCommittee MemberReginaDittmanForschungszentrum Jülich GmbH
Gate/MOL DielectricsCommittee MemberAndreaPadovaniApplied Materials
Gate/MOL DielectricsCommittee MemberMireiaBargallo-GonzalezInstitute of Microelectronics of Barcelona, CNM-CSIC
Gate/MOL DielectricsCommittee MemberMiguelMuñoz-RojoUniversity of Twente
Gate/MOL DielectricsCommittee MemberNaohitoSuzumuraRenesas
Gate/MOL DielectricsCommittee MemberStanislavTyaginovIMEC
Gate/MOL DielectricsCommittee MemberEilamYalonTechnion
Gate/MOL DielectricsCommittee MemberYuanyuanShiIMEC
IC Product ReliabilityTopic ChairJae-GyungAhnXilinx
IC Product ReliabilityVice ChairSouhirMhiraMentor Graphics
IC Product ReliabilityPast ChairFengXiaIntel
IC Product ReliabilityCommittee MemberDavideAppelloST
IC Product ReliabilityCommittee MemberPaoloBernardiPolitecnico di Torino
IC Product ReliabilityCommittee MemberSandhyaChandrashekharCypress
IC Product ReliabilityCommittee MemberStevenMittlIBM
IC Product ReliabilityCommittee MemberMing-HanHsiehMediatek
IC Product ReliabilityCommittee MemberLinCongNvidia
IC Product ReliabilityCommittee MemberRichard (Shiguo)RaoInphi
IC Product ReliabilityCommittee MemberDanielTilleInfineon
MemoryTopic ChairMing-YiLeeMacronix
MemoryVice Chair (MRAM)TetsuoEndohTohoku University
MemoryVice Chair (ReRAM)ShimengYuGeorgia Institute of Technology
MemoryPast ChairAndreaChimentonIntel
MemoryCommittee MemberGuohanHuIBM
MemoryCommittee MemberCarloCagliCEA
MemoryCommittee MemberJoeMcCrateMicron
MemoryCommittee MemberJiezhiChenShandong University
MemoryCommittee MemberSangBumKimSeoul National University
MemoryCommittee MemberGeorgTempelInfineon
MemoryCommittee MemberYuriTkachevMicrochip
MemoryCommittee MemberCristianZambelliUniversity of Ferrara
MemoryCommittee MemberWen-HsienKuoTSMC
MemoryCommittee MemberBarryO'Sullivanimec
Metallization/BEOL ReliabilityTopic ChairBaozhenLiIBM
Metallization/BEOL ReliabilityVice ChairRahimKasimIntel
Metallization/BEOL ReliabilityPast ChairValeriySukharevMentor Graphics
Metallization/BEOL ReliabilityCommittee MemberSeungmanChoiGlobalFoundries
Metallization/BEOL ReliabilityCommittee MemberMatsuyamaHideyaSocionext
Metallization/BEOL ReliabilityCommittee MemberAndrewKimIntel
Metallization/BEOL ReliabilityCommittee MemberKi-DonLeeSamsung
Metallization/BEOL ReliabilityCommittee MemberMing-HsienLinTSMC
Metallization/BEOL ReliabilityCommittee MemberGavinHallOn-Semi
Metallization/BEOL ReliabilityCommittee MemberKristofCroesIMEC
Metallization/BEOL ReliabilityCommittee MemberYoung-JoonParkTI
Metallization/BEOL ReliabilityCommittee MemberTianShenIBM
Metallization/BEOL ReliabilityCommittee MemberCher MingTanChang Gung Univ
Metallization/BEOL ReliabilityCommittee MemberShinjiYokogawaUniv. E. C
Process IntegrationTopic ChairMustaphaRafikST Microelectronics
Process IntegrationVice ChairAnisurRahmanIntel
Process IntegrationPast ChairHiroshiMikiHitachi
Process IntegrationCommittee MemberAdrianChasinIMEC
Process IntegrationCommittee MemberJen-HaoLeeTSMC
Process IntegrationCommittee MemberXavierGarrosCEA-LETI
Process IntegrationCommittee MemberHyun ChulSagongSamsung
Process IntegrationCommittee MemberGuidoSasseNXP
Process IntegrationCommittee MemberMotoyukiSatoMicron
Process IntegrationCommittee MemberRichardSouthwickIBM
Process IntegrationCommittee MemberSrinivasanPurushothamanGlobalFoundries
Reliabiity TestingTopic ChairJifaHaoOn Semiconductor
Reliability TestingVice ChairOsama O.AwadelkarimPenn State Univ.
Reliability TestingPast ChairDerekSlottkeIntel
Reliability TestingCommittee MemberHosainFarrQualitau
Reliability TestingCommittee MemberPraveenGunturiII-VI Inc
Reliability TestingCommittee MemberPeterPaliwodaGlobalFoundries
Reliability TestingCommittee MemberStéphaneMoreauCEA-Leti
Reliability TestingCommittee MemberJohnOrtegaIntel
Reliability TestingCommittee MemberFiorellaPozzobonSTMicroelectronics
Reliability TestingCommittee MemberBryanRootCeladon Systems
Reliability TestingCommittee MemberDirkRudolphGlobalFoundries
Reliability TestingCommittee MemberStephenRameyIntel
Reliability TestingCommittee MemberPascalSalomeSERMA Group
Reliability TestingCommittee MemberTimTurnerXact/Texas Semicon Labs
Reliability TestingCommittee MemberDurgamadhabMisraNew Jersey Institute of Technology
Reliability TestingCommittee MemberYiZhaoZhejiang University
Reliability TestingCommittee MemberKevinManningAnalog Devices
Reliability TestingCommittee MemberSamiaSulimanPenn State University
Soft ErrorTopic ChairIndranilChatterjeeAirbus
Soft ErrorVice ChairDaisukeKobayashiISAS JAXA
Soft ErrorPast ChairNihaarMahatmeNXP Semiconductors
Soft ErrorCommittee MemberLaurentArtolaOnera
Soft ErrorCommittee MemberEthanCannonBoeing
Soft ErrorCommittee MemberKrishna MohanChavaliGlobalFoundries
Soft ErrorCommittee MemberYi-PinFangTSMC
Soft ErrorCommittee MemberYanranChenXilinx
Soft ErrorCommittee MemberSimoneGerardinU. Padova
Soft ErrorCommittee MemberRuben GarciaAliaCERN
Soft ErrorCommittee MemberNelsonGaspardNASA
Soft ErrorCommittee MemberHaibinWangHohai University
Soft ErrorCommittee MemberMasanoriHashimotoOsaka University
System ReliabilityTopic ChairJaySarkarWestern Digital
System ReliabilityVice ChairFlavioGriggioMicrosoft
System ReliabilityPast ChairRobKwasnickIntel
System ReliabilityCommittee MemberMichaelAzarianU. Maryland
System ReliabilityCommittee MemberSandhyaChandrashekharCypress
System ReliabilityCommittee MemberJinseokKimSamsung
System ReliabilityCommittee MemberNikolaosPapandreouIBM Research Zurich
System ReliabilityCommittee MemberYanLiuMedtronic
System ReliabilityCommittee MemberGuneetSethiAmazon Lab 126
System ReliabilityCommittee MemberAmitMaratheGoogle
System ReliabilityCommittee MemberFlorianMoliereAirbus
System ReliabilityCommittee MemberYi-ChingOngTSMC
System ReliabilityCommittee MemberDavidSunderlandBoeing (Retired)
TransistorsTopic ChairJacopoFrancoIMEC
TransistorsVice ChairChetanPrasadIntel
TransistorsPast ChairTiborGrasserTUWien
TransistorsCommittee MemberGoelNileshBITS Pilani Dubai Campus
TransistorsCommittee MemberKazukiNomotoSony Semiconductor Solutions
TransistorsCommittee MemberJasonCampbellNIST
TransistorsCommittee MemberSubhadeepMukhopadhyayTSMC
TransistorsCommittee MemberMoonjuChoMicron
TransistorsCommittee MemberChangze (Chris)LiuHuawei
TransistorsCommittee MemberMontserratNafriaUniversitat Autonoma de Barcelona
TransistorsCommittee MemberEun-Ae (Grace)ChungSamsung
TransistorsCommittee MemberHokyungParkSK Hynix
TransistorsCommittee MemberWenLiuGlobalfoundries
TransistorsCommittee MemberRunshengWangPeking University
TransistorsCommittee MemberBonnieWeirBroadcom
TransistorsCommittee MemberAlainBravaixIM2NP (ST Micro)
Wide BandgapTopic ChairAivarsLelisUS Army Research Labs
Wide Bandgap (SiC)Vice ChairThomasAichingerInfineon
Wide Bandgap (GaN)Vice ChairSamehKhalilInfineon
Wide BandgapPast ChairSandeepBahlTI
Wide BandgapPast ChairMatteoMeneghiniU. Padova
Wide BandgapCommittee MemberAnantAgarwalOhio State Univ
Wide BandgapCommittee MemberAlbertoCastellazziKyoto University of Advanced Science
Wide BandgapCommittee MemberCharlesCheungNIST
Wide BandgapCommittee MemberFerdinandoIucolanoST
Wide BandgapCommittee MemberMikeUrenU. Bristol
Wide BandgapCommittee MemberDanLichtenwalnerCree-Wolfspeed
Wide BandgapCommittee MemberPeterLoseeUnited SiC
Wide BandgapCommittee MemberDavidSheridanAOS
Wide BandgapCommittee MemberHiroshiYanoUniv. of Tsukuba
Wide BandgapCommittee MemberShuzhenYouIMEC
Wide BandgapCommittee MemberHideyukiOkitaPanasonic
Wide BandgapCommittee MemberAlainCharlesInfineon
Wide BandgapCommittee MemberKiranChattyLittlefuse
Wide BandgapCommittee MemberSrabantiChowdhuryStanford University
Wide BandgapCommittee MemberUlrikeGrossnerETH Zurich
Wide BandgapCommittee MemberJoshiKaustubhTSMC
Wide BandgapCommittee MemberJosefLutzUniversity of Chemnitz
Wide BandgapCommittee MemberLucaPerniolaCEA, Leti
Wide BandgapCommittee MemberJunjiSenzakiAIST
Wide BandgapCommittee MemberBobStahlbushNaval Research Laboratory
Wide BandgapCommittee MemberAkinAkturkCoolCAD Electronics
Wide BandgapCommittee MemberShireenWarnockMIT Lincoln Labs
RF/mmW/5G ReliabilityTopic ChairFaridMedjdoubI.E.M.N - CNRS
RF/mmW/5G ReliabilityVice ChairJoseJimenezQorvo
RF/mmW/5G ReliabilityCommittee MemberRobertCoffieRLC solutions
RF/mmW/5G ReliabilityCommittee MemberMichaelDammannFraunhofer IAF
RF/mmW/5G ReliabilityCommittee MemberKrishnanshuDanduTI
RF/mmW/5G ReliabilityCommittee MemberFernandoGuarinGlobalFoundries
RF/mmW/5G ReliabilityCommittee MemberSriramkalpatQualcomm
RF/mmW/5G ReliabilityCommittee MemberDietmarKissingerUniversity of Ulm
RF/mmW/5G ReliabilityCommittee MemberNathalieMalbertUniversity of Bordeaux
RF/mmW/5G ReliabilityCommittee MemberVijayReddyTI
RF/mmW/5G ReliabilityCommittee MemberZuo-MinTsaiNational Chung Cheng University
Beyond CMOSTopic ChairCharlieSlaymanCisco Systems
Beyond CMOSCommittee MemberFeiHuiTechnion Institute of Technology, Israel
Beyond CMOSCommittee MemberJacopoFrancoimec
Beyond CMOSCommittee MemberMarioLanzaSoochow University
Beyond CMOSCommittee MemberMaxLemmeAachen University
Beyond CMOSCommittee MemberNagarajanRaghavanSingapore University of Technology and Design
Beyond CMOSCommittee MemberYuryIllarionovTU Wien