IRPS

Committee List

IRPS 2019 Committees

This interactive table shows the list of committee chairs, vice-chairs, and past-chairs. The table is sortable by clicking on column headers. The search box uses free-text to find matching instances of whatever is typed. Updates will be added as they become available.

Sub-CommitteeRoleFirst NameLast NameOrganization
Circuit Reliability/AgingChairGeorgiosKonstadinidisGoogle
Circuit Reliability/AgingVice ChairJimTschanzIntel
Circuit Reliability/AgingPast ChairChrisKimUniversity of Minnesota
Circuit Reliability/AgingMemberFlorianCachoSTMicroelectronics
Circuit Reliability/AgingMemberKarlHofmannInfineon
Circuit Reliability/AgingMemberPong-FeiLuIBM
Circuit Reliability/AgingMemberTomKopleyONSemiconductors
Circuit Reliability/AgingMemberKazutoshiKobayashiKyoto Institue of Technology
Circuit Reliability/AgingMemberVijayReddyTexas Instruments
Circuit Reliability/AgingNew MemberHyewonShimSamsung
Circuit Reliability/AgingNew MemberMingooSeokColumbia Univrsity
Circuit Reliability/AgingNew MemberShimengYuArizona State University
Gate/MOL DielectricsChairAndrewKimIBM
Gate/MOL DielectricsMemberMarioLanzaSoochow Universityersity
Gate/MOL DielectricsPast ChairNagarajanRaghavanSingapore U. of Technology and Design
Gate/MOL DielectricsMemberStanislavTyaginovIMEC
Gate/MOL DielectricsMemberFrancesco MariaPuglisiUniMORE
Gate/MOL DielectricsMemberYung-HueiLeeTSMC
Gate/MOL DielectricsMemberNaohitoSuzumuraRenesas
Gate/MOL DielectricsMemberShinjiYokogawaUEC
Gate/MOL DielectricsNew MemberEnriqueMirandaUniversitat Autonoma de Barcelona
Gate/MOL DielectricsNew MemberShih-ChangChenTSMC
Gate/MOL DielectricsNew MemberRaviAchantaGlobalFoundries
Gate/MOL DielectricsNew MemberJiezhiChenShandong University
Gate/MOL DielectricsNew MemberAndreaPadovaniMDLSoft
ESD/LatchupChairGianlucaBoselliTexas Instruments
ESD/LatchupVice ChairShih-HungChenIMEC
ESD/LatchupPast ChairMichaelKhazhinskySilicon Labs
ESD/LatchupMemberLorenzoCeratiST Microelectronics
ESD/LatchupMemberMototsuguOkushimaRenesas
ESD/LatchupMemberMichaelStockinger         NXP
ESD/LatchupMemberTeruoSuzukiSocionext Inc.                                                                                   
ESD/LatchupMemberZhongChenUniversity of Arkansas
ESD/LatchupMemberMayankShrivastavaIndian Institute of Science
ESD/LatchupMemberGuidoNotermansNexperia
ESD/LatchupMemberDionyzPoganiTU Wien
ESD/LatchupMemberKaiEsmarkInfineon
Failure AnalysisChairBaohuaNiuTSMC
Failure AnalysisVice ChairJaneLiNVidia
Failure AnalysisPast ChairKevinJohnsonIntel
Failure AnalysisMemberBrendanForanThe Aerospace Corporation
Failure AnalysisMemberBryanTracyEAG Laboratories
Failure AnalysisMemberEckhardLangerGlobalFoundries
Failure AnalysisMemberKenRodbellIBM
Failure AnalysisNew MemberXieYifenMA-Tek
Failure AnalysisNew MemberJasonWheelerRaytheon
Failure AnalysisNew MemberStephenFasolinoRaytheon
Failure AnalysisNew Member
MemoryChairAndreaChimentonIntel
MemoryVice ChairLucaPerniolaCEA
MemoryPast ChairAlessandroSpinelliPolitecnico di Milano
MemoryMemberCristianZambelliUniversity of Ferrara
MemoryMemberMing-YiLeeMacronix
MemoryMemberKab-JinNamSamsung
MemoryNew MemberGeorgTempelInfineon
MemoryNew MemberJoeMcCrateMicron
MemoryNew MemberYuriTkachevmicrochip
MemoryNew MemberDimitriHoussameddineIBM
MemoryNew MemberWeiZhiqiangPanasonic
MemoryNew MemberKenTakeuchiChuo University Japan
Metallization/BEOL ReliabilityChairValeriySukharevMentor Graphics
Metallization/BEOL ReliabilityVice ChairBaozhenLiIBM
Metallization/BEOL ReliabilityPast ChairGavinHallON Semi
Metallization/BEOL ReliabilityMemberZsoltTokeiIMEC
Metallization/BEOL ReliabilityMemberMatsuyamaHideyaSocionext
Metallization/BEOL ReliabilityMemberSumitKapadiaIntel
Metallization/BEOL ReliabilityMemberKi-DonLeeSamsung
Metallization/BEOL ReliabilityMemberMing-HsienLinTSMC
Metallization/BEOL ReliabilityMemberTakamasaUsuiToshiba
Metallization/BEOL ReliabilityNew MemberStephaneMoreauCEA-LETI
Metallization/BEOL ReliabilityNew MemberKong-BoonYeapApple
Metallization/BEOL ReliabilityNew memberGennadiBersukerAerospace Corporation
Process IntegrationChairHiroshiMikiHitachi
Process IntegrationVice ChairMustaphaRafikST Microelectronics
Process IntegrationPast ChairXavierGarrosCEA - LETI
Process IntegrationMemberAdrianChasinIMEC
Process IntegrationMemberJen-HaoLeeTSMC
Process IntegrationMemberAnisurRahmanIntel
Process IntegrationMemberGuidoSasseNXP
Process IntegrationNew MemberHyunchulSagongSamsung
Process IntegrationNew MemberMotoyukiSatoMicron
Process IntegrationNew MemberPurushothamanSrinivasanGlobal Foundries
Process IntegrationNew MemberRichardSouthwickIBM
IC Product ReliabilityChairFengXiaIntel
IC Product ReliabilityVice ChairSouhirMhiraMentor Graphics
IC Product ReliabilityPast ChairBrianPedersenIntel
IC Product ReliabilityMemberJae-GyungAhnXilinx
IC Product ReliabilityMemberShou-EnLiuMediatek
IC Product ReliabilityMemberStevenMittlIBM
IC Product ReliabilityMemberBalajiNarasimhamBroadcom Limited
IC Product ReliabilityMemberJ. R.ShihTSMC
IC Product ReliabilityMemberCongLinNvidia
Reliabiity TestingChairDerekSlottkeIntel
Reliability TestingVice ChairJifaHaoOn Semiconductor
Reliability TestingPast ChairKevinManningAnalog Devices
Reliability TestingMemberBryanRootCeladon Systems
Reliability TestingMemberHosainFarrQualitau
Reliability TestingMemberStéphaneMoreauCEA-Leti
Reliability TestingMemberFiorellaPozzobonSTMicroelectronics
Reliability TestingMemberDirkRudolphGlobalFoundries
Reliability TestingMemberPascalSalomeSerma Technologies
Reliability TestingMemberTimTurnerXact/Texas Semicon Labs
Reliability TestingMemberYiZhaoZhejiang University
Reliability TestingNew MemberJohnOrtegaIntel
Reliability TestingNew MemberFlavioGriggioMicrosoft
Reliability TestingNew MemberTimothyMcMullenFormFactor
Reliability TestingNew MemberLoicTheolierIMS-Université de Bordeaux
Soft ErrorChairNihaarMahatmeNXP Semiconductors
Soft ErrorVice ChairIndranilChatterjeeAirbus
Soft ErrorPast ChairMartaBagatinU. Padova
Soft ErrorMemberEthanCannon Boeing
Soft ErrorNew MemberLaurentArtolaOnera
Soft ErrorNew MemberSimoneGerardinU. Padova
Soft ErrorNew MemberShi-JieWenCisco
Soft ErrorNew MemberZacharyDigginsSpace X
Soft ErrorNew MemberDanielLimbrickNC A&T
Soft ErrorNew MemberNelsonGaspardIntel
Soft ErrorNew MemberYi-PinFangTSMC
Soft ErrorNew MemberHaibinWanghhuc (?)
Soft ErrorNew MemberDaisukeKobayashiisas (?)
System ReliabilityChairRobKwasnickIntel
System ReliabilityVice ChairJaySarkarWestern Digital
System ReliabilityPast ChairGuneetSethiAmazon Lab 126
System ReliabilityMemberPradeepLallAuburn University
System ReliabilityMemberDavidSunderlandBoeing (Retired)
System ReliabilityMemberAmitMaratheGoogle
System ReliabilityNew MemberKingsukMaitraMicrosoft
System ReliabilityNew MemberDigantaDasU. Maryland
System ReliabilityNew MemberVincentHuardST Micro
System ReliabilityNew MemberFlorianMoliereAirbus
System ReliabilityNew MemberYanLiuMedtronic
System ReliabilityNew MemberYi-ChingOngTSMC
TransistorsChairTiborGrasserTUWien
TransistorsVice ChairJasonCampbellNIST
TransistorsPast ChairSteveRameyIntel
TransistorsMemberSouvikMahapatraIndia Institute of Technology
TransistorsMemberJacopoFrancoIMEC
TransistorsMemberChrisLiuHuawei
TransistorsMemberRickiSouthwickIBM
TransistorsMemberPurushothamanSrinivasanGlobalfoundries
TransistorsMemberBonnieWeirBroadcom
TransistorsMemberLucaLarcherUniversityersity of Modena
TransistorsMemberMontserratNafriaUniversityersitat Autonoma de Barcelona
TransistorsMemberJurriaanSchmitzUniversityersity of Twente
TransistorsNew MemberDaweiHehTSMC
TransistorsNew MemberKiyoshiTakeuchiTokyo University
TransistorsNew MemberRunshengWangPeking University
TransistorsNew MemberShinyaYamakawaSony
Wide BandgapChairMatteoMeneghiniU. Padova
Wide BandgapVice ChairAivarsLelisUS Army Research Labs
Wide BandgapPast ChairSandeepBahlTI
Wide BandgapMemberSteveStoffelsIMEC
Wide BandgapMemberKenichiroTanakaPanasonic
Wide BandgapMemberDeepakVeereddyInfineon
Wide BandgapMemberAbhishekBanerjeeON
Wide BandgapMemberShireenWarnockMIT Lincoln labs
Wide BandgapMemberAlbertoCastellazziU. Nottingham
Wide BandgapMemberFerdinandoIucolanoST
Wide BandgapMemberDavidSheridanAOS
Wide BandgapMemberPeterLoseeGE
Wide BandgapMemberMartinKuballU. Bristol
Wide BandgapNew MemberDanLichtenwalnerCree-Wolfspeed
Wide BandgapNew MemberCharlesCheungNIST
Beyond CMOS/NeuromorphicChairGennadiBersukerAerospace Corporation
Beyond CMOS/NeuromorphicVice ChairMatteoMarinellaSandia
Beyond CMOS/NeuromorphicNew MemberAkinagaHiroAdvanced Industrial Science and Technology (AIST, Japan)
Beyond CMOS/NeuromorphicNew MemberRozaKotlyarIntel
Beyond CMOS/NeuromorphicNew MemberAnChenSemiconductor Research Corporation (SRC)
Beyond CMOS/NeuromorphicNew MemberDoo-SeokJeongHanyang University (Korea)
Beyond CMOS/NeuromorphicNew MemberKin-LeongPeySingapore U. of Technology and Design
Beyond CMOS/NeuromorphicNew MemberJohn-PaulStrachanHewlett-Packared Enterprise
Beyond CMOS/NeuromorphicNew MemberTuo-Hung (Alex)HoussameddineChiao Tung Unioversity (Taiwan)
Beyond CMOS/NeuromorphicNew MemberEricVogelGeorgia Tech
Beyond CMOS/NeuromorphicNew MemberStefanoAmbrogioIBM Almaden Research Center
Beyond CMOS/NeuromorphicNew MemberArthurEdwardsAir Force Research Laboratory (AFRL)
Beyond CMOS/NeuromorphicNew MemberSabinaSpigaCNR-IMM
Beyond CMOS/NeuromorphicNew MemberRobinDegraeveimec
Beyond CMOS/NeuromorphicNew MemberGabrielMolasLETI