2020 IRPS Highlighted papers

Award from IRPS 2019

IRPS 2019 BEST PAPER, entitled “Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms”

IRPS 2019 BEST STUDENT PAPER, entitled “Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based Vertical Trench MOSFETs (OG-FETs)”

IRPS 2019 BEST POSTER, entitled “Characterization and Modelling of High Speed Ge Photodetectors Reliability”

2020 IRPS Highlighted Papers