IRPS

Reliability Year in Review

Reliability Year-In-Review

Monday, April 18
2:30 p.m. – 5:30 p.m.
Yuan Chen, Chair

TimeTitleSpeaker
2:30 pm - 3:15 pmDielectric Breakdown – FEOL and BEOLJim Stathis
IBM
3:15 pm - 4:00 pmMetallization ReliabilityJeff Gambino
ON Semiconductor
4:00 pm - 4:15 pmBreak
4:15 pm - 5:00 pmTransistor TechnologiesTanya Nigam
Globalfoundries