Abstract Submission

***IRPS is now accepting Late News submissions. The deadline for Late News submissions is January 11, 2016.***

Please read everything on this screen before submitting your paper.

Once you have read all the instructions ; to submit your abstract, email your pdf to the IRPS Conference Office to the attention of Polly Mahoney at:

Please include the area that you are submitting your paper to for review. The link for the list of suggested areas is at the bottom of this screen.

The 2016 IEEE International Reliability Physics Symposium will be held April 17-21, 2016 at the Hilton Pasadena, Pasadena, CA, USA.

IRPS offers its attendees technical sessions, tutorials, workshops, a year-in-review seminar and a poster session, all covering state-of-the-art developments in the reliability physics of electronic and optoelectronic devices, materials, and systems. Attendees returning from the IRPS will be better equipped to solve critical reliability problems and develop effective qualification procedures that affect their companies’ bottom line.

For detailed information for the 2016 IRPS submission, CLICK HERE for the 2016 IRPS Call for Papers

Abstracts are due by 11:59 PM EDT on October 12, 2015. All abstracts must be submitted electronically. Only pdf file format can be accepted. Abstracts exceeding two pages in length will not be accepted; the paper size must be either 8.5″ x 11″ (Letter) or A4. The minimum allowable font size is 10 point Times New Roman or 11 point Calibri. Abstracts typically contain one page of text and one page of figures. The work described in your abstract must be original. The abstract should highlight the novelty of the work and place it in the context of previous works. Specific results, e.g. data or model equations, must be provided to demonstrate that the work is complete and to allow for the outcomes to be evaluated. Following abstract review, full manuscripts of accepted papers will be due before the conference.

Late Paper Submission: Space permitting, full-length manuscripts with late breaking news may be considered for inclusion in the conference/proceedings. Late Papers Must Be Received By: January 11, 2016.


  • Identify new or improve our understanding of the physics of failure and modeling of mechanisms in electronic and optoelectronic devices, materials, and systems;
  • Identify how fabrication processes influence the susceptibility of product to particular physical failure mechanisms;
  • Quantify the impact of device and circuit design, as well as material and process selection on reliability;
  • Present new, innovative, or improved failure analysis techniques;
  • Describe reliability testing/stressing, qualification, and screening methodologies or strategies for materials, devices, circuits, or chips; either at wafer- or module-level for commercial or “extreme” environments;
  • Demonstrate techniques to build-in or extend reliability while meeting performance goals, especially as technologies are scaled.


In addition to the Best & Outstanding Paper awards and the Best Poster award, IRPS will be presenting a Best Student Paper Award. To qualify for the student paper award, the IRPS oral presentation must be given by a student and the first author must be that same student. Please indicate upon submission of an abstract if you would like to be considered for this award.