IRPS

Reliability Year in Review

The 2017 IRPS Reliability Year in Review will take place on Monday, April 3rd at 2:30 – 5:00 pm.

TitleSpeaker
Memory Technology ReliabilityBob Gleixner, Micron
FinFET ReliabilityAaron Thean, NUS (formerly imec)
GaN RF and Power Transistor ReliabilityMatteo Meneghini, U. Padova