IRPS

Committee List

IRPS 2017 Committees

This interactive table shows the complete list of committee members, along with chairs and vice-chairs. The table is sortable by clicking on column headers. The search box uses free-text to find matching instances of whatever is typed. Updates will be added as they become available.

A PDF formatted list of committee members can be found HERE.

CommitteeRoleFirst NameLast NameAffiliation
3D/2.5D/PackagingChairAlanLuceroIntel
3D/2.5D/PackagingVice-ChairSudarshanRangarajAmazon Lab 126
Circuit Reliability/AgingChairVijayReddyTexas Instruments
Circuit Reliability/AgingVice-ChairChrisKimUniversity of Minnesota
Dielectrics - Gate, MOL, BEOLCo-ChairYung-HeiLeeTSMC
Dielectrics - Gate, MOL, BEOLCo-ChairNagarajanRaghavanSingapore University of Technology and Design
ESD/LatchupChairFarzanFarbizTexas Instruments
ESD/LatchupVice-ChairMichaelKhazhinskySI Labs
Failure Analysis/Process IntegrationChairBryanTracyEAG Laboratories
Failure Analysis/Process IntegrationVice-ChairKevinJohnsonIntel
Metallization ReliabilityChairKi-DonLeeSamsung
Metallization ReliabilityVice-ChairGavinHallON Semi
PhotovoltaicsChairAndreaCesterUniversity of Padova
PhotovoltaicsVice-ChairMichaelDaenenHasselt University
Product/MemoryChairAlessandroSpinelliPolitecnico di Milano
Product/MemoryVice-ChairBrianPedersenIntel
Reliability TestingChairHosainFarrQualitau
Reliability TestingVice-ChairKevinManningAnalog Devices
Soft ErrorChairBalajiNarasimhamBroadcom
Soft ErrorVice-ChairMartaBagatinUniversity of Padova
System ReliabilityChairAjayKamathGoogle
System ReliabilityVice-ChairGuneetSethiAmazon Lab 126
Transistors/Beyond CMOSChairSouvikMahapatraIndia Institute of Technology
Transistors/Beyond CMOSVice-ChairSteveRameyIntel
Wide Band GapChairDenisMarconIMEC
Wide Band GapVice-ChairSandeepBahlTexas Instruments
3D/2.5D/PackagingMemberAndyBaoQualcom
3D/2.5D/PackagingMemberDavidHuitinkUniv. of Arkansas
3D/2.5D/PackagingMemberPradyumnaPrabhumirashiApple
3D/2.5D/PackagingMemberRichardRaoMicrosemi
Circuit Reliability/AgingMemberDavidBurnettGlobalFoundries
Circuit Reliability/AgingMemberFlorianCachoSTMicroelectronics
Circuit Reliability/AgingMemberKevinCaoASU
Circuit Reliability/AgingMemberVikasChandraARM
Circuit Reliability/AgingMemberKarlHofmannInfineon
Circuit Reliability/AgingMemberGeorgiosKonstadinidisOracle
Circuit Reliability/AgingMemberHaldunKufluogluQualcomm
Circuit Reliability/AgingMemberPong-FeiLuIBM
Circuit Reliability/AgingMemberJimTschanzIntel
Dielectrics - Gate, MOL, BEOLMemberRaChantaIBM
Dielectrics - Gate, MOL, BEOLMemberLinCongNVidia
Dielectrics - Gate, MOL, BEOLMemberMartinGallFraunhofer Institute
Dielectrics - Gate, MOL, BEOLMemberRuHuangPeking University
Dielectrics - Gate, MOL, BEOLMemberAndrewKimIBM
Dielectrics - Gate, MOL, BEOLMemberJamesLloydSUNY Poly
Dielectrics - Gate, MOL, BEOLMemberMariaLuqueSamsung
Dielectrics - Gate, MOL, BEOLMemberEnriqueMirandaUAB
Dielectrics - Gate, MOL, BEOLMemberPaulNicollianSemiconductor Reliability
Dielectrics - Gate, MOL, BEOLMemberChetanPrasadIntel
Dielectrics - Gate, MOL, BEOLMemberFrancesco MariaPuglisiUnimore
Dielectrics - Gate, MOL, BEOLMemberNaohitoSuzumuraRenesas
Dielectrics - Gate, MOL, BEOLMemberChristopheValleeCEA
Dielectrics - Gate, MOL, BEOLMemberDmitryVekslerNIST
Dielectrics - Gate, MOL, BEOLMemberBonnieWeirBroadcom
Dielectrics - Gate, MOL, BEOLMemberShnjiYokogawaUEC
ESD/LatchupMemberShih-HungChenIMEC
ESD/LatchupMemberZhongChenUniversity of Arkansas
ESD/LatchupMemberKaiEsmarkInfineon
ESD/LatchupMemberMujahidMuhammadGlobalFoundries
ESD/LatchupMemberNicolasNolhierLaboratoire d'analyse et d'architecture des systèmes
ESD/LatchupMemberGuidoNotermansNXP
ESD/LatchupMemberMotoOkushimaRenesas
ESD/LatchupMemberAlanRighterAnalog Devices
ESD/LatchupMemberMayankShrivastavaIndian Institute of Science
Failure Analysis/Process IntegrationMemberBrendanForanAerospace Corporation
Failure Analysis/Process IntegrationMemberEckhardLangerGlobalfoundries
Failure Analysis/Process IntegrationMemberSiddarthKrishnanApplied Materials
Failure Analysis/Process IntegrationMemberJaneLiNVidia
Failure Analysis/Process IntegrationMemberJimO'DonnellIntel
Failure Analysis/Process IntegrationMemberGuillaumeRibesSTMicroelectronics
Failure Analysis/Process IntegrationMemberKenRodbellIBM
Metallization ReliabilityMemberLinjunCaoGlobalFoundries
Metallization ReliabilityMemberHowardGanSMIC
Metallization ReliabilityMemberBaozhenLiIBM
Metallization ReliabilityMemberMing-HsienLinTSMC
Metallization ReliabilityMemberCher MingTanChang Gung University, Taiwan
Metallization ReliabilityMemberZsoltTokeiIMEC
Metallization ReliabilityMemberFengXiaIntel
PhotovoltaicsMemberFernando A.CastroNational Physical Laboratory
PhotovoltaicsMemberCosimoGerardiEnel Green Power S.p.A., 3Sun
PhotovoltaicsMemberSurenGevorgyanDTU Energy, Technical University of Denmark
PhotovoltaicsMemberSalvatoreLombardoCNR-IMM, Italy
PhotovoltaicsMemberEszterVoroshaziIMEC, Belgium
PhotovoltaicsMemberMartinWeisInstitute of Electronics and Photonics, Slovak University of Technology
PhotovoltaicsMemberKarl-AndersWeißFraunhofer-Institut für Solare Energiesysteme ISE
Product/MemoryMemberJohnAgnessRohm Semiconductor
Product/MemoryMemberJae-GyungAhnXilinx
Product/MemoryMemberMarcAoulaicheMicron
Product/MemoryMemberPierre Chor-FungChiaCisco
Product/MemoryMemberEric (Ming-Hsiu)LeeMacronix
Product/MemoryMemberLucaPerniolaCEA
Product/MemoryMemberNagarajanRaghavanSingapore University of Technology and Design
Product/MemoryMemberRichardRaoMicrosemi
Product/MemoryMemberAamerShaukatFreescale
Product/MemoryMemberPengSuJuniper
Product/MemoryMemberJanVan HoudtIMEC
Product/MemoryMemberCristianZambelliUniversity of Ferrara
Reliability TestingMemberPascalSalomeSerma Technologies
Reliability TestingMemberStéphaneMoreauCEA-Leti
Reliability TestingMemberFiorellaPozzobonSTMicroelectronics
Reliability TestingMemberDirkRudolphGlobalFoundries
Reliability TestingMemberPascalSalomeSerma Tehnologies
Soft ErrorMemberThiagoAssisRCI
Soft ErrorMemberBharatBhuvaVanderbilt
Soft ErrorMemberIndranilChaterjeeAirbus
Soft ErrorMemberMikeDionRockwell Collins
Soft ErrorMemberAdrianEvansiRoC
Soft ErrorMemberYi-PinFangaTSMC
Soft ErrorMemberChristopherFrostRutherford Appleton Laboratory
Soft ErrorMemberGillesGasiotSTMicroelectronics
Soft ErrorMemberShahJahinuzzamanIntel
Soft ErrorMemberMichaelKingSandia Labs
Soft ErrorMemberNihaarMahatmeNXP
Soft ErrorMemberPhilOldigesIBM
Soft ErrorMemberHeatherQuinnLANL
Soft ErrorMemberTaikiUemuraSamsung
Soft ErrorMemberShi-JieWenCisco
System ReliabilityMemberRandyCrutchfieldMedtronic
System ReliabilityMemberAamirKaziDell
System ReliabilityMemberAmitMaratheGoogle
System ReliabilityMemberRajPendseQualcomm
System ReliabilityMemberShalabhTandonIntel
Transistors/Beyond CMOSMemberJasonCampbellNIST
Transistors/Beyond CMOSMemberChrisChangze LiuSamsung
Transistors/Beyond CMOSMemberSumanDattaNorte Dame
Transistors/Beyond CMOSMemberXavierFederspielSTMicroelectronics
Transistors/Beyond CMOSMemberJacopoFrancoIMEC
Transistors/Beyond CMOSMemberDaweiHehTSMC
Transistors/Beyond CMOSMemberEricPopStanford
Transistors/Beyond CMOSMemberNagarajanRaghavanSUTD
Transistors/Beyond CMOSMemberGuidoSasseNXP
Transistors/Beyond CMOSMemberMotoyukiSatoMicron
Transistors/Beyond CMOSMemberPurushothamanSrinivasanGlobalfoundries
Transistors/Beyond CMOSMemberStanislavTyaginovTU Wien
Transistors/Beyond CMOSMemberDhanoopVargheseTexas Instruments
Transistors/Beyond CMOSMemberMiaomiaoWangIBM
Wide Band GapMemberAndrewBarnesESA
Wide Band GapMemberPartha SarathiChakrabortyNXP Semiconductors
Wide Band GapMemberJoseJimenezQorvo
Wide Band GapMemberRobertKaplarSandia National Laboratories
Wide Band GapMemberSamehKhaliInfineon
Wide Band GapMemberMartinKuballUniversity of Bristol
Wide Band GapMemberFerdinandoLucolanoSTMicroelectronics
Wide Band GapMemberMatteoMeneghiniUniversity of Padova
Wide Band GapMemberPeterMoensON Semiconductor
Wide Band GapMemberDavidSheridanAlpha and Omega Semiconductor
Wide Band GapMemberKenichiroTanakaPanasonic Corporation